Simplified single-shot geometries for quantitative phase imaging using the transport of intensity equation

The transport of intensity equation (TIE) has emerged as a powerful and versatile approach for retrieving phase information from intensity measurements. It offers label-free high-resolution imaging capability. In the TIE, at least two intensity recordings are required for phase retrieval for which either the sample or sensor is mechanically displaced, which creates an error in computation. Single-shot imaging is a technique where all essential intensity measurements needed to solve the TIE are captured simultaneously within a single exposure. Therefore, it overcomes the usual problems of the TIE. In this paper, we propose two simplified versions of single-shot experimental geometries following the Michelson interferometer architecture for phase imaging using the TIE. Through an optical experiment, we demonstrate the efficacy and versatility of the single-shot imaging technique with different object samples.

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Publication Details

Journal
Applied Optics
Published
2025-02-04
DOI
https://doi.org/10.1364/ao.545779
Citations
6
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
11.30

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article

Simplified single-shot geometries for quantitative phase imaging using the transport of intensity equation

Naveen K. Nishchal, Ram Kumar
6 citations
Applied Optics
Advanced X-ray Imaging Techniques
11.30
article

Simplified single-shot geometries for quantitative phase imaging using the transport of intensity equation

Naveen K. Nishchal, Ram Kumar
article en
6 citations

Abstract

The transport of intensity equation (TIE) has emerged as a powerful and versatile approach for retrieving phase information from intensity measurements. It offers label-free high-resolution imaging capability. In the TIE, at least two intensity recordings are required for phase retrieval for which either the sample or sensor is mechanically displaced, which creates an error in computation. Single-shot imaging is a technique where all essential intensity measurements needed to solve the TIE are captured simultaneously within a single exposure. Therefore, it overcomes the usual problems of the TIE. In this paper, we propose two simplified versions of single-shot experimental geometries following the Michelson interferometer architecture for phase imaging using the TIE. Through an optical experiment, we demonstrate the efficacy and versatility of the single-shot imaging technique with different object samples.

Applied OpticsVol. 64(7)
Indian Institute of Technology Patna (IN)
Council of Scientific and Industrial Research, India
Openalex Percentile: Top 1%
Advanced X-ray Imaging Techniques
11.30
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Simplified single-shot geometries for quantitative phase imaging using the transport of intensity equation — Naveen K. Nishchal, Ram Kumar · Applied Optics (2025) | TGRS Research Map | TGRS