Detection of electron temperature anisotropy by an x-ray crystal spectrometer in the Large Helical device

Abstract We examine Ar XVI spectra measured by an x-ray crystal spectrometer to estimate electron temperature anisotropy in high-temperature electron cyclotron heated plasmas in the Large Helical Device (LHD). We calculate the atomic structure and electron impact excitation cross section between magnetic sublevels of Ar XVI. By assuming a bi-Maxwellian electron distribution function and considering the mount parameters of the x-ray spectrometer in LHD, we model the expected intensity ratio q/r as a function of T e ⊥ B and T e ∣∣ B , where ⊥ B and ∣∣ B denote perpendicular and parallel components to the magnetic axis of toroidal plasma, respectively. The calculation results show that the intensity ratio of q and r, which are formed by inner-shell excitation from the ground state of Ar 15+ , is sensitive to electron temperature anisotropy. We apply the calculation results to the LHD experiments. The ratio of q/r changes with variations in electron density and collision frequency. In the core and low ν e region, T e ⊥ B is predominant, and the electron temperature becomes isotropic above ν e > 10 4 Hz. By combining electron temperature measurements from Thomson scattering and radial profile of Ar 15+ ions estimated using the extreme ultraviolet spectrometer, local values of T e ⊥ B / T e ∣∣ B are quantitatively estimated using the q/r ratio. The derived T e ⊥ B / T e ∣∣ B is compared with collision frequency, radial electric field, and effective helical ripple, and the experimental results are explained qualitatively.

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Publication Details

Journal
Physica Scripta
Published
2025-02-04
DOI
https://doi.org/10.1088/1402-4896/adb242
Citations
2
Primary Topic
Silicon and Solar Cell Technologies
Type
article
Field-Weighted Citation Impact
1.46

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article

Detection of electron temperature anisotropy by an x-ray crystal spectrometer in the Large Helical device

T. Oishi, M. Goto, Y. Kawamoto, H. Funaba et al.
2 citations
Physica Scripta
Silicon and Solar Cell Technologies
1.46
article

Detection of electron temperature anisotropy by an x-ray crystal spectrometer in the Large Helical device

T. Oishi, M. Goto, Y. Kawamoto, H. Funaba, Tomoko Kawate, I. Yamada, H. Takahashi
article en
2 citations

Abstract

Abstract We examine Ar XVI spectra measured by an x-ray crystal spectrometer to estimate electron temperature anisotropy in high-temperature electron cyclotron heated plasmas in the Large Helical Device (LHD). We calculate the atomic structure and electron impact excitation cross section between magnetic sublevels of Ar XVI. By assuming a bi-Maxwellian electron distribution function and considering the mount parameters of the x-ray spectrometer in LHD, we model the expected intensity ratio q/r as a function of T e ⊥ B and T e ∣∣ B , where ⊥ B and ∣∣ B denote perpendicular and parallel components to the magnetic axis of toroidal plasma, respectively. The calculation results show that the intensity ratio of q and r, which are formed by inner-shell excitation from the ground state of Ar 15+ , is sensitive to electron temperature anisotropy. We apply the calculation results to the LHD experiments. The ratio of q/r changes with variations in electron density and collision frequency. In the core and low ν e region, T e ⊥ B is predominant, and the electron temperature becomes isotropic above ν e > 10 4 Hz. By combining electron temperature measurements from Thomson scattering and radial profile of Ar 15+ ions estimated using the extreme ultraviolet spectrometer, local values of T e ⊥ B / T e ∣∣ B are quantitatively estimated using the q/r ratio. The derived T e ⊥ B / T e ∣∣ B is compared with collision frequency, radial electric field, and effective helical ripple, and the experimental results are explained qualitatively.

Physica ScriptaVol. 100(3)
The Graduate University for Advanced Studies, SOKENDAI (JP), Tohoku University (JP), National Institute for Fusion Science (JP)
Japan Society for the Promotion of Science
Openalex Percentile: Top 20%
Silicon and Solar Cell Technologies
1.46
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