Achieving Ntn’s Full-Potential

When it comes to implementing NTNs there are many technical challenges, so proper test scenarios and procedures are critical, as Tomohide Yamazaki explains

Publication Details

Journal
New Electronics
Published
2024-11-01
DOI
https://doi.org/10.12968/s0047-9624(25)60018-6
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

Achieving Ntn’s Full-Potential

New Electronics
VLSI and Analog Circuit Testing
article

Achieving Ntn’s Full-Potential

article en

Abstract

When it comes to implementing NTNs there are many technical challenges, so proper test scenarios and procedures are critical, as Tomohide Yamazaki explains

New ElectronicsVol. 57(11)
Openalex Percentile: Top 71%
VLSI and Analog Circuit Testing
DOISourceOpenAlex
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Achieving Ntn’s Full-Potential · New Electronics (2024) | TGRS Research Map | TGRS