Two-step large-area synthesis of Bi2Se3 topological insulator thin films via bismuth evaporation and selenization
Bi 2 Se 3 is recognized as one of the most promising topological insulators, with substantial potential for industrial applications, particularly as a qubit in quantum computing. Realizing large-area growth using cost-effective methods is crucial for practical applications. This study presents an innovative approach for fabricating high-quality large-area Bi 2 Se 3 thin films by combining Bi thermal evaporation with cracker selenization, which inherently supports scalability. The amorphous precursor—a Bi film capped with a Se layer—reacts with highly reactive cracked Se, forming crystalline Bi 2 Se 3 thin films with layered structures. Prolonged selenization enhances the crystallinity of the Bi 2 Se 3 thin films and significantly reduces their oxygen content by effectively substituting the O atoms with Se atoms. Thicker precursors require extended selenization to improve their crystallinity and are more susceptible to stress. Electrical transport measurements of Bi 2 Se 3 films formed via selenization for 8 h reveal a long phase coherence length of >375 nm and a single surface state with a spin texture, which are unique properties of topological insulators. Uniform physical and optical properties are achieved across a substrate with a large 4-in diameter under optimized conditions. This novel method exhibits great potential for the industrial fabrication of high-quality large-area Bi 2 Se 3 topological insulator thin films. • Scalable method for high-quality large-area Bi 2 Se 3 films via Bi evaporation and selenization • Enhanced crystallinity and reduced oxygen content with prolonged selenization • Phase coherence length > 375 nm and single spin-textured surface state in Bi 2 Se 3 films • Uniform properties across 4-in. substrates using optimized conditions
Authors
- Yong‐Duck Chung (ORCID: https://orcid.org/0000-0002-2200-6994)
- Dae‐Hyung Cho (ORCID: https://orcid.org/0000-0001-8194-4270)
- Tae‐Ha Hwang (ORCID: https://orcid.org/0000-0003-4166-202X)
- Soyoung Lim
- W. Lee (ORCID: https://orcid.org/0000-0003-3116-0472)
Institutions
- Electronics and Telecommunications Research Institute (KR)
- Advanced Device Technology (United States) (US)
- Korea University of Science and Technology (KR)
Publication Details
- Journal
- Surface and Coatings Technology
- Published
- 2025-02-03
- DOI
- https://doi.org/10.1016/j.surfcoat.2025.131878
- Citations
- 4
- Primary Topic
- Topological Materials and Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 4.99
Funders
- Electronics and Telecommunications Research Institute
- Ministry of Science and ICT, South Korea