From the Society
Dear members, colleagues, and friends of the IEEE Instrumentation and Measurement Society (IMS), As the new President of the IMS, I am honored to greet you in this new issue of IEEE Instrumentation & Measurement Magazine. If you are a new IMS member, welcome! And if you are a returning member, welcome back! Thanks to the selfless efforts and dedication of our IMS community, including the IMS Administrative Committee (AdCom), over the past few years we have become part of a community that has excelled in many aspects. Allow me to elaborate.
Authors
- Shervin Shirmohammadi (ORCID: https://orcid.org/0000-0002-3973-4445)
Institutions
- University of Ottawa (CA)
Publication Details
- Journal
- IEEE Instrumentation & Measurement Magazine
- Published
- 2025-02-01
- DOI
- https://doi.org/10.1109/mim.2025.10870088
- Primary Topic
- Advanced Electrical Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00