Use of the Nanogate‑38 Camera for Beam Diagnostics at the VEPP‑2000 Collider

The Nanogate‑38 gated camera was used to measure the transverse beam dimensions in the BEP booster of the VEPP‑2000 electron−positron collider. The camera is used to measure the vertical beam size by a double-slit interferometer and to visualize a transverse beam profile in single-turn mode with the projection optics. The purpose of the experiments is to assess the applicability of the camera to measurements of the transverse beam dimensions and beam emittance in accelerator experiments at the SKIF synchrotron-radiation source.

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Publication Details

Journal
Instruments and Experimental Techniques
Published
2024-10-01
DOI
https://doi.org/10.1134/s0020441224701653
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Use of the Nanogate‑38 Camera for Beam Diagnostics at the VEPP‑2000 Collider

V. L. Dorokhov, I. A. Terent’ev, M. V. Timoshenko, M. I. Krutik et al.
Instruments and Experimental Techniques
Advanced X-ray Imaging Techniques
article

Use of the Nanogate‑38 Camera for Beam Diagnostics at the VEPP‑2000 Collider

V. L. Dorokhov, I. A. Terent’ev, M. V. Timoshenko, M. I. Krutik, О. И. Мешков, V. E. Boyarkina
article en

Abstract

The Nanogate‑38 gated camera was used to measure the transverse beam dimensions in the BEP booster of the VEPP‑2000 electron−positron collider. The camera is used to measure the vertical beam size by a double-slit interferometer and to visualize a transverse beam profile in single-turn mode with the projection optics. The purpose of the experiments is to assess the applicability of the camera to measurements of the transverse beam dimensions and beam emittance in accelerator experiments at the SKIF synchrotron-radiation source.

Instruments and Experimental TechniquesVol. 67(5)
Novosibirsk State University (RU), Boreskov Institute of Catalysis (RU), Moscow Institute of Entrepreneurship and Law (RU), Budker Institute of Nuclear Physics (RU), Novosibirsk State Technical University (RU)
Openalex Percentile: Top 65%
Advanced X-ray Imaging Techniques
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