Electronic band structure of GaN diluted and overdiluted with group-V elements
The technology for manufacturing $\mathrm{Ga}\mathrm{N}$-based devices is already very mature, but band engineering in this technology is still limited to mixing group-III elements, while the incorporation of group-V elements into $\mathrm{Ga}\mathrm{N}$ can create possibilities in band-gap engineering. In this work, we report comprehensive experimental studies of the electronic band structure for $\mathrm{As}$-diluted and overdiluted $\mathrm{Ga}\mathrm{N}\mathrm{As}$ supported by computational methods based on the state-of-the-art density-functional-theory (DFT) approach. These studies clearly demonstrated that the incorporation of arsenic into $\mathrm{Ga}\mathrm{N}$ modifies the valence band, while the conduction band remains undisturbed up to 8% arsenic content. For the first time, $\mathrm{As}$-related changes in the valence band are studied with high resolution in electron photoemission spectroscopy. $\mathrm{As}$-related narrowing of the energy gap is also detected in the absorption spectra. These experimental observations are very consistent with the calculations of the electronic band structure for $\mathrm{Ga}\mathrm{N}\mathrm{As}$, and therefore the same DFT approach was used to calculate the electronic band structure for $\mathrm{Ga}\mathrm{N}$ diluted and overdiluted with the remaining group-V elements, i.e., $\mathrm{Ga}\mathrm{NP}$, $\mathrm{Ga}\mathrm{N}\mathrm{Sb}$, and $\mathrm{Ga}\mathrm{N}\mathrm{Bi}$. In this case, it is also clearly visible that adding $\mathrm{P}$, $\mathrm{Sb}$, or $\mathrm{Bi}$ to $\mathrm{Ga}\mathrm{N}$ modifies the valence band, while the conduction band remains undisturbed when the V-group concentration does not exceed 5%.
Authors
- R. Kudrawiec (ORCID: https://orcid.org/0000-0003-2593-9172)
- Jakub Ziembicki (ORCID: https://orcid.org/0000-0002-6332-6986)
- P. Scharoch (ORCID: https://orcid.org/0000-0001-7358-8755)
- D. Hommel (ORCID: https://orcid.org/0000-0003-3425-8408)
- D. Pucicki (ORCID: https://orcid.org/0000-0003-1039-3381)
- M. Grodzicki (ORCID: https://orcid.org/0000-0002-2671-8008)
- Wojciech Olszewski (ORCID: https://orcid.org/0000-0003-2237-2887)
- Maciej P. Polak (ORCID: https://orcid.org/0000-0001-7198-7779)
- Rafał Bartoszewicz (ORCID: https://orcid.org/0009-0001-2951-1459)
Institutions
- Wrocław University of Science and Technology (PL)
- University of Wisconsin System (US)
- University of Wisconsin–Madison (US)
- Łukasiewicz Research Network – PORT Polish Center for Technology Development (PL)
- AGH University of Krakow (PL)
Publication Details
- Journal
- Physical Review Applied
- Published
- 2025-02-03
- DOI
- https://doi.org/10.1103/physrevapplied.23.024005
- Citations
- 2
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 2.52