Laser discharge in a high-pressure jet of heavy noble gas: Expansion of emitting volume promises an efficient source of EUV light for lithography

A discharge with multiply charged ions of a noble gas supported by a powerful infrared laser in a high-pressure jet is considered as a source of extreme ultraviolet (EUV) light radiation in particular narrow bands demanded by next-generation lithography. In a proof-of-principle experiment in krypton, the EUV-emitting region is visualized using a dedicated EUV microscope. Measurements support a basic model of underlying physics that involves expansion of the emitting plasma outside the laser focus. In simulations, we show that using the xenon jet, more optimal for EUV emission, may provide an efficiency competitive to the best commercial EUV sources for lithography.

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Publication Details

Journal
Physical Review Applied
Published
2025-02-03
DOI
https://doi.org/10.1103/physrevapplied.23.024004
Citations
2
Primary Topic
Laser-induced spectroscopy and plasma
Type
article
Field-Weighted Citation Impact
1.73

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article

Laser discharge in a high-pressure jet of heavy noble gas: Expansion of emitting volume promises an efficient source of EUV light for lithography

С. В. Голубев, A. A. Perekalov, I. S. Abramov, Н. И. Чхало et al.
2 citations
Physical Review Applied
Laser-induced spectroscopy and plasma
1.73
article

Laser discharge in a high-pressure jet of heavy noble gas: Expansion of emitting volume promises an efficient source of EUV light for lithography

С. В. Голубев, A. A. Perekalov, I. S. Abramov, Н. И. Чхало, E. D. Gospodchikov, A. N. Nechay, A. G. Shalashov
article en
2 citations

Abstract

A discharge with multiply charged ions of a noble gas supported by a powerful infrared laser in a high-pressure jet is considered as a source of extreme ultraviolet (EUV) light radiation in particular narrow bands demanded by next-generation lithography. In a proof-of-principle experiment in krypton, the EUV-emitting region is visualized using a dedicated EUV microscope. Measurements support a basic model of underlying physics that involves expansion of the emitting plasma outside the laser focus. In simulations, we show that using the xenon jet, more optimal for EUV emission, may provide an efficiency competitive to the best commercial EUV sources for lithography.

Physical Review AppliedVol. 23(2)
Institute for Physics of Microstructures (RU), Institute of Applied Physics (RU)
Russian Science Foundation
Affordable and clean energy
Openalex Percentile: Top 20%
Laser-induced spectroscopy and plasma
1.73
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