SI-Traceable Line Intensity of H<sub>2</sub>O near 1.393 µm

We recently reported the quantity values of line intensity for H2O near 1.393 µm in a manner traceable to the International System of Units (SI). This paper briefly describes how to determine the reliable values of the line intensity, mainly focusing on the SI-traceability.

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Publication Details

Journal
Plasma and Fusion Research
Published
2025-01-22
DOI
https://doi.org/10.1585/pfr.20.2401002
Primary Topic
Surface Roughness and Optical Measurements
Type
article
Field-Weighted Citation Impact
0.00

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article

SI-Traceable Line Intensity of H2O near 1.393 µm

Koji Hashiguchi, Hisashi Abe, Agata Cygan, R. Ciuryło et al.
Plasma and Fusion Research
Surface Roughness and Optical Measurements
article

SI-Traceable Line Intensity of H2O near 1.393 µm

Koji Hashiguchi, Hisashi Abe, Agata Cygan, R. Ciuryło, Daniel Lisak, Minami Amano
article en

Abstract

We recently reported the quantity values of line intensity for H2O near 1.393 µm in a manner traceable to the International System of Units (SI). This paper briefly describes how to determine the reliable values of the line intensity, mainly focusing on the SI-traceability.

Plasma and Fusion ResearchVol. 20(0)
Nicolaus Copernicus University (PL), FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ)
Core Research for Evolutional Science and Technology
Openalex Percentile: Top 98%
Surface Roughness and Optical Measurements
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