Chemical Analysis in the Gemological Laboratory: XRF and LA-ICP-MS

The primary chemical analysis methods applied in gemology are XRF, which uses X-ray emissions for nondestructive testing, and LA-ICP-MS, which provides detailed analysis and greater sensitivity. LA-ICP-MS has become essential for origin determination and treatment detection.

Authors

Michael C. Jollands (ORCID: https://orcid.org/0000-0003-1442-5133)
Aaron C. Palke
Ziyin Sun

Publication Details

Journal: Gems & Gemology
Published: 2025-01-29
DOI: https://doi.org/10.5741/gems.60.4.536
Citations: 2
Primary Topic: Mineralogy and Gemology Studies
Type: article
Field-Weighted Citation Impact: 2.67

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article

Chemical Analysis in the Gemological Laboratory: XRF and LA-ICP-MS

Michael C. Jollands, Aaron C. Palke, Ziyin Sun

Jan 29, 2025

2 citations

Gems & Gemology

Mineralogy and Gemology Studies

2.67

article

Chemical Analysis in the Gemological Laboratory: XRF and LA-ICP-MS

Michael C. Jollands, Aaron C. Palke, Ziyin Sun

January 29, 2025article en

2 citations

Abstract

Gems & GemologyVol. 60(4)

Openalex Percentile: Top 13%

Mineralogy and Gemology Studies

2.67

DOI Open Access PDF OpenAlex

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Chemical Analysis in the Gemological Laboratory: XRF and LA-ICP-MS — Michael C. Jollands, Aaron C. Palke, et al. · Gems & Gemology (2025) | TGRS Research Map | TGRS