Total Ionizing Dose in 130-nm and 55-nm SiGe:C Heterojunction Bipolar Transistors
Authors
- M. Bouhouche
- Tadec Maraine
- P. Chevalier (ORCID: https://orcid.org/0000-0003-1848-9986)
- J. Boch (ORCID: https://orcid.org/0000-0002-5660-7501)
- S. Haendler
- A. Hoffmann (ORCID: https://orcid.org/0000-0002-0697-4215)
- A. Adebabay Belie
- B. Sagnes (ORCID: https://orcid.org/0000-0002-6324-8594)
- Fabien Pascal
- D. Gloria
Institutions
- Institut d'Électronique et des Systèmes (FR)
Publication Details
- Journal
- SPIRE - Sciences Po Institutional REpository
- Published
- 2024-09-16
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Université de Montpellier
- Région Occitanie Pyrénées-Méditerranée
- European Regional Development Fund