Evaluation of X-Ray Irradiation Effects on Solid Polymer Electrolyte Memristor Devices
In this study, we present the impact of irradiation on the memristive properties of solid polymer electrolyte memristor devices with a Ti/PMA/PEO/PMA/(Ti or Au) structure. The devices were measured before irradiation and after 1 krad and 2 krad total doses. The effects of irradiation appear to be an improvement in both conductance and hysteresis after the first 1 krad dose, and a destruction of hysteresis (the Au bottom device) or conductance (the Ti bottom devices) after the second dose.
Authors
- M. Roca (ORCID: https://orcid.org/0000-0003-4648-5683)
- Stavros G. Stavrinides (ORCID: https://orcid.org/0000-0001-8484-1402)
- Neil Timothy Kemp (ORCID: https://orcid.org/0000-0002-1906-4608)
- Michael A. Gater (ORCID: https://orcid.org/0009-0001-5258-8390)
- Jean‐Sebastien G. Bouillard (ORCID: https://orcid.org/0000-0002-6942-1749)
- Rodrigo Picos (ORCID: https://orcid.org/0000-0002-9167-6422)
- Carol de Benito (ORCID: https://orcid.org/0000-0001-9021-3381)
- Ali M. Adawi (ORCID: https://orcid.org/0000-0001-6850-5679)
Institutions
- University of Nottingham (GB)
- Democritus University of Thrace (GR)
- University of Hull (GB)
- Universitat de les Illes Balears (ES)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/icecs61496.2024.10849275
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- University of Nottingham