High Frequency Analysis of Inductor Temperature Dependence for On-Chip LC-Based Frequency Reference
In a typical LC cross-coupled oscillator operating in free-running mode and intended as an on-chip frequency reference, the frequency drift due to the temperature-induced inductance variation is studied. By analyzing the parameters of a simple cylindrical conductor and then a more realistic inductance, it has been shown that the section plays a key role in thermal frequency drift. For a frequency of 40 GHz, designing the inductor with a section of 48 μm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> instead of 12μm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> enables a reduction of the temperature coefficient of frequency (TCF) of more than 30 %, reaching -19ppm/°C over a temperature range from -40 °C to 140 °C, without frequency compensation.
Authors
- N. Dehaese (ORCID: https://orcid.org/0009-0006-2469-2058)
- Camille Robert (ORCID: https://orcid.org/0000-0001-5951-6405)
- J. Lajoinie
- H. Barthélemy (ORCID: https://orcid.org/0000-0003-2902-1094)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université de Toulon (FR)
- Aix-Marseille Université (FR)
- STMicroelectronics (France) (FR)
- Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (FR)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/icecs61496.2024.10849288
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00