Quasar - Boosting the Evaluation of the Variability Effects on Radiation Sensitivity

This work presents a tool developed to boost the evaluation of the variability effects on the radiation sensitivity in detail at an electrical level. The tool can handle from small basic cells to median multi gate circuits in few seconds, speeding-up the traditional fault injection mechanism based on large number of electrical simulations. The tool explores logical masking to reduce the design space exploration and parallelism to speed up the circuit level evaluation. To show the applicability of the tool, this work presents results for circuits of a 2-input XOR function in complementary and transmission gate topologies.