SET-SAT: Susceptibility Analysis Tool of Single Event Transients for Combinational Cells

Radiation-induced impacts have become more significant due to the trend towards circuit miniaturization, directly affecting circuits reliability. When the reliability is compromised, it can result in an unexpected behavior, such as malfunctions or signal disruptions. For this reason, an accurate evaluation of circuit reliability is essential for fault-tolerant approaches. This could enable a robust reliability-aware automated design flow. Under these conditions, this work proposes SET-SAT, a tool capable of analyze the radiation susceptibility for a given combinational logic gate layout design. It can extract and compute the susceptible area of cell's active diffusion, where particles may impact given an input vector. Three different standard cell libraries were used to demonstrate the potential of the proposed tool. As far as we know, this is the first work to propose an open-source tool for assessing layout-level susceptibility of a cell library without electrical simulations.