A Charge Injection Neutralization Technique for Wide-Band Interleaved DAC
This paper presents a novel current-steering RF DAC design in 28nm CMOS FDSOI technology. The architecture enhances linearity, minimizes energy consumption, and ensures scalability for high-frequency applications. It includes a modified differential pair with neutralizing capacitors, cascode transistors, and body-biasing to mitigate charge injection and Miller effects. The low-power design enables high interleaving capacity, suitable for interleaved Digital-to-Analog Converters (DAC). Simulation results show an 8GHz maximum frequency and 2.504mW power consumption, making it a promising candidate for efficient high-performance RF applications.
Authors
- Pierre Ferrer (ORCID: https://orcid.org/0000-0002-0148-2967)
- Yann Deval (ORCID: https://orcid.org/0000-0002-7358-8904)
- François Rivet (ORCID: https://orcid.org/0000-0002-6003-4208)
- Hervé Lapuyade
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université de Bordeaux (FR)
- Laboratoire de l'Intégration du Matériau au Système (FR)
- Institut Polytechnique de Bordeaux (FR)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/icecs61496.2024.10849346
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00