A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy

Abstract This study presents the design and implementation of a side entry laser system designed for an ultrahigh vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. The authors argue that new capabilities hold the potential to transform the electron microscope from an analysis tool toward a more flexible synthesis system, where atomic scale fabrication and atom‐by‐atom experiments can be performed.