The measurement and analysis of optical properties of Gaussian thin films

This study designs and implements a system for the measurement and analysis of the optical properties of Gaussian thin films, aimed at accurately measuring key optical parameters such as laser reflectance and transmittance. The system employs dual-path data acquisition technology, utilizing laser scanning of the thin film in conjunction with a data acquisition card to achieve efficient data collection and analysis. The software is developed based on the QT framework, integrating OpenGL for the visualization of 3D intensity distribution maps. The system features real-time display, ease of operation, and high-precision measurement, with a final measurement accuracy of up to 1%. Experimental results show that the system can effectively evaluate the optical properties of Gaussian thin films, providing reliable technical support for their measurement and analysis.