Atomic layer deposition of nanofilms on porous polymer substrates: Strategies for success
Atomic layer deposition (ALD) is a versatile technique for engineering the surfaces of porous polymers, imbuing the flexible, high-surface-area substrates with inorganic and hybrid material properties. Previously reported enhancements include fouling resistance, electrical conductance, thermal stability, photocatalytic activity, hydrophilicity, and oleophilicity. However, there are many poorly understood phenomena that introduce challenges in applying ALD to porous polymers. In this paper, we address five common challenges and ways to overcome them: (1) entrapped precursor, (2) embrittlement, (3) film fracture, (4) deformation, and (5) pore collapse. These challenges are often interrelated and can exacerbate one another. To investigate these phenomena, we applied various ALD chemistries to porous polymers including polyethersulfone, polysulfone, polyvinylidene fluoride, and polycarbonate track-etched membranes. Reaction-diffusion modeling revealed why certain precursors and processing conditions result in embrittling subsurface material growth, entrapment of unreacted precursors, and nongrowth. We quantify the limits of ALD processing temperatures that are dictated by thermal expansion mismatch and can lead to fractured ALD films. The results herein allow us to make recommendations to avoid, mitigate, or overcome the difficulties encountered when performing ALD and plasma-enhanced ALD on porous polymers. We intend this article to serve as a “lessons learned” guide informed by previous experience to provide a better understanding of the difficulties and limitations of ALD on porous polymers and knowledge-based guidelines for successful depositions. This knowledge can accelerate future research and help experimentalists navigate and troubleshoot as they expose porous polymers to reactive precursor vapors.
Authors
- Rajesh Pathak (ORCID: https://orcid.org/0000-0002-4237-4209)
- Philippe Miele (ORCID: https://orcid.org/0000-0003-3530-8120)
- Jeffrey W. Elam (ORCID: https://orcid.org/0000-0002-5861-2996)
- Tamar Segal‐Peretz (ORCID: https://orcid.org/0000-0003-3222-6429)
- Brian C. Welch (ORCID: https://orcid.org/0000-0002-9747-045X)
- Jeanne Casetta (ORCID: https://orcid.org/0009-0002-6720-9960)
- Céline Pochat‐Bohatier (ORCID: https://orcid.org/0000-0002-9053-2216)
Institutions
- École Nationale Supérieure de Chimie de Montpellier (FR)
- Argonne National Laboratory (US)
- Centre National de la Recherche Scientifique (FR)
- Technion – Israel Institute of Technology (IL)
- Université de Montpellier (FR)
- Institut Européen des Membranes (FR)
Publication Details
- Journal
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
- Published
- 2025-01-22
- DOI
- https://doi.org/10.1116/6.0004187
- Citations
- 8
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 5.84
Funders
- BIRD Foundation
- Ministry of Energy, Israel
- Horizon 2020 Framework Programme
- Argonne National Laboratory