SPIRAL+: Efficient Signal–Power Integrity Co-Analysis for Interchiplet Links Validation

Chiplet technology has recently emerged as a promising solution to improving chip performance through the modularization of complex designs and communication facilitated by high-speed interchiplet serial links. However, the increasing on-package routing density and data rates of these links introduce complex signal and power integrity challenges, surpassing those encountered in traditional large monolithic chips. Addressing these complexities with efficient analysis and design tools is crucial for maintaining design robustness. In this article, we propose SPIRAL+: signal-power integrity co-analysis framework for high-speed interchiplet serial links validation. The framework employs machine learning (ML) to construct transmitter models and utilizes an impulse response extraction method for modeling the channel and receiver. It then performs signal-power integrity co-analysis through a novel double-edge response-based method, leveraging the developed equivalent models. Additionally, an efficient ML model is crafted to accurately predict eye diagram metrics. The analysis provides valuable insights for design optimization. Experimental results show that SPIRAL+ achieves eye diagrams with a mean relative error of 0.07%–7.47%, while realizing a speedup of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$31\times $ </tex-math></inline-formula>–<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$326\times $ </tex-math></inline-formula> over traditional commercial tools.

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Publication Details

Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
2025-01-22
DOI
https://doi.org/10.1109/tcad.2025.3532822
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00

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article

SPIRAL+: Efficient Signal–Power Integrity Co-Analysis for Interchiplet Links Validation

Songyu Sun, Dawei Gao, Zhiguo Shi, Yangfan Jiang et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
VLSI and Analog Circuit Testing
article

SPIRAL+: Efficient Signal–Power Integrity Co-Analysis for Interchiplet Links Validation

Songyu Sun, Dawei Gao, Zhiguo Shi, Yangfan Jiang, Cheng Zhuo, Jingtong Hu, Xiao Dong
article en

Abstract

Chiplet technology has recently emerged as a promising solution to improving chip performance through the modularization of complex designs and communication facilitated by high-speed interchiplet serial links. However, the increasing on-package routing density and data rates of these links introduce complex signal and power integrity challenges, surpassing those encountered in traditional large monolithic chips. Addressing these complexities with efficient analysis and design tools is crucial for maintaining design robustness. In this article, we propose SPIRAL+: signal-power integrity co-analysis framework for high-speed interchiplet serial links validation. The framework employs machine learning (ML) to construct transmitter models and utilizes an impulse response extraction method for modeling the channel and receiver. It then performs signal-power integrity co-analysis through a novel double-edge response-based method, leveraging the developed equivalent models. Additionally, an efficient ML model is crafted to accurately predict eye diagram metrics. The analysis provides valuable insights for design optimization. Experimental results show that SPIRAL+ achieves eye diagrams with a mean relative error of 0.07%–7.47%, while realizing a speedup of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$31\times $ </tex-math></inline-formula>–<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$326\times $ </tex-math></inline-formula> over traditional commercial tools.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsVol. 44(8)
University of Pittsburgh (US), Zhejiang University (CN)
National Natural Science Foundation of China
Affordable and clean energy
Openalex Percentile: Top 99%
VLSI and Analog Circuit Testing
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