Temperature Effect on the Electromagnetic Susceptibility of Analog Sensors
This article investigates the temperature effect on the electromagnetic susceptibility (EMS) of analog sensors through theoretical analysis and testing. The combined effects of electromagnetic interference (EMI) and temperature variation on analog sensors are analyzed based on the circuit principle of the operational amplifier. The test platform is constructed by using the equipment of bulk current injection (BCI) method and a temperature chamber, which are utilized to evaluate the temperature effect on the EMS of two different analog sensors. The results show that with the same EMI, temperature variations lead to differences in EMS of analog sensors.
Authors
- Jingxuan Chen (ORCID: https://orcid.org/0009-0004-4643-3714)
- Zhenli L. He (ORCID: https://orcid.org/0000-0001-7761-2070)
- Guangzhi Chen (ORCID: https://orcid.org/0000-0001-8500-0824)
- Zhiyu Jia (ORCID: https://orcid.org/0000-0002-7991-6972)
- Ran Sun (ORCID: https://orcid.org/0000-0002-5181-3242)
- Junhao Zhang (ORCID: https://orcid.org/0000-0002-2382-6097)
Institutions
- Hefei Institute of Technology Innovation (CN)
- China Academy of Launch Vehicle Technology (CN)
- Beihang University (CN)
Publication Details
- Published
- 2024-10-23
- DOI
- https://doi.org/10.1109/isape62431.2024.10840897
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00