Application of Mode Filtering in Near-Field Measurements

This paper briefly introduces the theory of planar near-field measurement and applies cylindrical mode filtering to correct errors in planar near-field measurements. This method decomposes the far-field pattern obtained from planar near-field measurements into cylindrical wave modes. By exploiting the spatial constraint relationship between the cylindrical wave spectrum and the tested antenna, scattering components are filtered out. Finally, the processed far-field pattern is obtained through cylindrical wave spectrum to far-field transformation. By measuring a horn antenna, the algorithmically processed directional pattern is compared with the pattern from simulation software. The results indicate that the algorithm effectively reduces the impact of scattering errors on the far-field pattern.

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Publication Details

Published
2024-10-23
DOI
https://doi.org/10.1109/isape62431.2024.10841226
Primary Topic
Electromagnetic Compatibility and Measurements
Type
article
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article

Application of Mode Filtering in Near-Field Measurements

Mingwei Hu, Zhipeng Zhang, Bing Wei
Electromagnetic Compatibility and Measurements
article

Application of Mode Filtering in Near-Field Measurements

Mingwei Hu, Zhipeng Zhang, Bing Wei
article en

Abstract

This paper briefly introduces the theory of planar near-field measurement and applies cylindrical mode filtering to correct errors in planar near-field measurements. This method decomposes the far-field pattern obtained from planar near-field measurements into cylindrical wave modes. By exploiting the spatial constraint relationship between the cylindrical wave spectrum and the tested antenna, scattering components are filtered out. Finally, the processed far-field pattern is obtained through cylindrical wave spectrum to far-field transformation. By measuring a horn antenna, the algorithmically processed directional pattern is compared with the pattern from simulation software. The results indicate that the algorithm effectively reduces the impact of scattering errors on the far-field pattern.

Xidian University (CN)
Openalex Percentile: Top 76%
Electromagnetic Compatibility and Measurements
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