Suppression of Tunneling Dark Current Through M-Region Tuning in InAs/GaSb VLWIR Photodetectors
As the cutoff wavelength of InAs/GaSb type-II superlattice infrared photodetectors is extended from mid-wavelength to very long-wavelength, the bandgap in the absorber layer exhibits a progressive narrowing. In the case of infrared photodetectors with PIMN structures, this phenomenon results in a rapid increase in the tunneling dark current between the I and M regions. In this paper, we present a very long-wavelength InAs/GaSb infrared photodetector with a PIMN structure, in which the depletion region is shifted from between the I- and M-regions to between the M- and N-regions. This was achieved by modifying the doping type of the M-region to a slight p-type and reducing the thickness of the M-region. This resulted in the effective suppression of the tunneling dark current. Following theoretical and experimental optimization, the device exhibited a quantum efficiency exceeding 31% at 77 K for an M-region thickness of 166 nm and a cutoff wavelength of more than 14 μm. The activation energy, Ea, increases from 31 meV to 42 meV (half the bandgap) when the device is between 90 K and 150 K, indicating that the dominant dark current of the device changes from tunneling dark current to Generation-recombination dark current. Following optimization, the RA<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">bulk</sub> of the device increased by over 60 times, reaching a value of 182 Ω-cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>, while the tunneling dark current was significantly suppressed.
Authors
- Yifan Shan
- Zhuanghao Yue
- Faran Chang
- Shancheng Yan (ORCID: https://orcid.org/0000-0003-2574-3479)
- Yi Shi (ORCID: https://orcid.org/0000-0002-1082-0315)
- Nong Li (ORCID: https://orcid.org/0000-0002-4945-392X)
- Ye Zhang (ORCID: https://orcid.org/0009-0001-7723-4986)
- Guowei Wang (ORCID: https://orcid.org/0000-0002-4660-3750)
- Ruoyu Xie
- Yingqiang Xu
- Liang Yan (ORCID: https://orcid.org/0009-0005-4774-4781)
- Hongyue Hao
- Dongwei Jiang
- Donghai Wu (ORCID: https://orcid.org/0000-0003-0327-0332)
- Zhichuan Niu (ORCID: https://orcid.org/0000-0002-9566-6635)
- Haiqiao Ni
- Wenguang Zhou (ORCID: https://orcid.org/0009-0002-9819-348X)
Institutions
- Chinese Academy of Sciences (CN)
- Nanjing University of Posts and Telecommunications (CN)
- Institute of Semiconductors (CN)
- Nanjing University (CN)
Publication Details
- Journal
- Journal of Lightwave Technology
- Published
- 2025-01-22
- DOI
- https://doi.org/10.1109/jlt.2025.3532751
- Citations
- 3
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 2.19