Imaging Electron Beam-Sensitive Twisted Hybrid Perovskite Bilayers at One-Angstrom Resolution
Twisted halide perovskite bilayers, a type of moiré material, show square moiré patterns with exciting optical properties. Atomic-scale structure analysis and its correlation with properties are difficult to achieve due to the extreme sensitivity of organic-inorganic halide perovskites to the illuminated electron beam in conventional/scanning transmission electron microscopy. Here, we developed a low-dose exit wave reconstruction methodology with a real-space resolution of one angstrom at ∼50 e/Å<sup>2</sup>, which recovers the phase information on the moiré fringes in CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> (MAPbI<sub>3</sub>) twisted perovskite bilayers at atomic scale, enabling detailed structural analysis of defects and corresponding strain distribution in such moiré materials. This work provides an atomic-level understanding of electron beam-sensitive twisted bilayer materials.
Authors
- Libai Huang (ORCID: https://orcid.org/0000-0001-9975-3624)
- Shuchen Zhang (ORCID: https://orcid.org/0000-0001-8560-0045)
- Hongsheng Shi (ORCID: https://orcid.org/0000-0002-9498-1932)
- Yi Yu (ORCID: https://orcid.org/0000-0003-4326-5992)
- Yuan Lu
- Dewei Sun
- Letian Dou (ORCID: https://orcid.org/0000-0001-6411-8591)
Institutions
- University of Science and Technology of China (CN)
- Davidson College (US)
- Purdue University West Lafayette (US)
- ShanghaiTech University (CN)
- Institute of Nanotechnology (GB)
- Division of Materials Science and Engineering (AU)
Publication Details
- Journal
- ACS Nano
- Published
- 2025-01-22
- DOI
- https://doi.org/10.1021/acsnano.4c11759
- Citations
- 4
- Primary Topic
- Perovskite Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 2.92
Funders
- National Natural Science Foundation of China
- ShanghaiTech University
- Fundamental Research Funds for the Central Universities
- Basic Energy Sciences