An Adaptive Residual Coordinate Attention-Based Network for Hat and Mask Wearing Detection in Kitchen Environments
In order to ensure food safety, it is required for personnel to wear hats and masks during food handling processes. To accurately detect the wearing status of kitchen staff, the ARP-YOLO model is proposed. Firstly, images are obtained from multiple kitchens and angles to construct a dataset reflecting the wearing status of hats and masks. To simulate more complex kitchen environments, Gaussian noise is added to the data and lighting conditions are adjusted for data augmentation. Lighting conditions in the kitchen can affect detection, causing the same target to exhibit different shapes and features under different lighting conditions, leading to missed detections. To address the above issues, we propose ARCA (Adaptive-Residual-Coordinate-Attention), which uses residual connections to strengthen attention to important features while preserving original features, and employs adaptive convolution reduction to reduce module parameters. To improve target localization accuracy, P2 detection layers are added in the Neck to obtain more accurate target position information. The ARP-YOLO model demonstrates significant improvements over the baseline model, with a 13.6% increase in Recall, allowing for more effective target capture and reduced missed detection risk. Additionally, [email protected] has increased by 10%, enhancing target localization accuracy. The F1-Score has also increased by 7.4%, better balancing the relationship between Precision and Recall. To validate the effectiveness of the model, comparative experiments with other models are conducted, showing that ARP-YOLO model's Recall and Average Precision(AP) are higher than those of other models.
Authors
- Bei Qi
- Huomin Dong
- Hao Chen (ORCID: https://orcid.org/0000-0003-1087-2868)
- Xiaoming Wu (ORCID: https://orcid.org/0000-0003-0268-0217)
- Xiangzhi Liu (ORCID: https://orcid.org/0009-0002-3874-5289)
- Ying Zhao (ORCID: https://orcid.org/0000-0002-4113-8423)
Institutions
- Qilu University of Technology (CN)
- Shandong Academy of Sciences (CN)
Publication Details
- Published
- 2024-10-06
- DOI
- https://doi.org/10.1109/smc54092.2024.10831817
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China-Shandong Joint Fund
- National Key Research and Development Program of China