Capacity Planning Accuracy and the Effect of Dyanmic Dedication Changes for a Single Wafer Lot Semiconductor Factory

In the context of a single wafer lot semiconductor factory characterized by high levels of Research and Development (RD) work-in-progress (WIP), low levels of product-based lots and lengthy cycle times, this paper investigates the accuracy of capacity planning given the impact of dynamic changes in dedication. We delve into several critical aspects related to dedication planning, drawing insights from historical data and dispatch logic used. The experimental results show the improvement in model accuracy with the incorporation of dedication changes as distribution functions.