Research on Nanotechnology SRAM-based FPGA Single Event Effect In-orbit Detection System

SRAM-based FPGAs for aerospace have entered the era of nanotechnology. Nanotechnology SRAM-based FPGA exhibits new single event effect (SEE) sensitivity characteristics and new types of SEE, and it is necessary to establish a new method for SEE ground test evaluation and in-orbit prediction applicable to nanotechnology SRAM-based FPGA. In-orbit testing is an important means of correcting new ground methods and verifying their effectiveness. This article focuses on the research of in-orbit detection methods for the SEE of nanotechnology SRAM-based FPGAs, breaking through key technologies such as in-orbit autonomous operation management and multi vector testing, developing in-orbit detection systems, and completing the in-orbit detection of typical devices. This provides in-orbit data support for correcting and verifying the ground test evaluation and in-orbit prediction new methods for the SEE capability of nanotechnology SRAM-based FPGAs.