Experimental Study of β-Ga2O3 Schottky Barrier Diodes with Single Field Plate Termination
Vertical β-Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> Schottky barrier diode (β-Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> SBD) was fabricated by using a single field plate (SFP) architecture. The diode forward current voltage (I-V) and reverse I-V were carried out by Agilent B1505A high-voltage semiconductor analyzer systems. V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</inf> of the SFP-SBD was 0.97V at a forward current density of 1A/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>, and the forward current density of the SBD was 324A/cm2, corresponding specific on-resistance (R<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on,sp</inf>) was 9.27mΩ.cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> when forward voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">F</inf>) is 3V at room temperature. Breakdown voltage (BV) was 478V defined at the reverse current density (I<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>) of 1A/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>. Meanwhile, we analyzed the reason for the sample's breakdown, the cross-section image of field plate area showed the difference in BV between simulated and real devices, which is helpful to better design the Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>-based power device.
Authors
- Mingzhe Li (ORCID: https://orcid.org/0000-0001-8743-5637)
- Zhiqiang Wang (ORCID: https://orcid.org/0000-0001-5946-8407)
- Liyang Zhu (ORCID: https://orcid.org/0000-0001-8155-1039)
- Ruoshi Peng (ORCID: https://orcid.org/0000-0002-3975-2475)
- Guoqing Xin (ORCID: https://orcid.org/0000-0002-2536-6346)
- Jun Yuan (ORCID: https://orcid.org/0000-0001-5936-3058)
- Shaodong Xu
Institutions
- Huazhong University of Science and Technology (CN)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/sslchinaifws64644.2024.10835296
- Citations
- 3
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.35