A Monolithically Integrated Voltage Reference based on AlGaN/GaN Schottky Gate HEMTs
In this work, a monolithically integrated voltage reference based on AlGaN/GaN Schottky Gate High Electron Mobility Transistor (SG-HEMTs) technology is proposed and studied by TCAD simulations. This simple but stable voltage reference consists of only two D-mode transistors with different threshold voltages, which can generate a predictable reference voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf>) and maintain high stability over a wide range of supply voltage and temperature. It is verified by TCAD simulations that V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf> of 1.48V is realized for the power supply voltage range of 3.3 to 10 V. In the temperature range of 300 K to 500 K, the sensitivity of the VREF line is 0.064%/V and the temperature coefficient is 8.21 ppm/°C. The proposed design of the reference voltage source composed of double D-mode SG-HEMT exhibits high feasibility, and can be used in bias and detection circuits to reduce the circuit complexity and chip area.
Authors
- Luqiao Yin
- Wen‐Qing Lu (ORCID: https://orcid.org/0009-0000-5400-7185)
- Kailin Ren (ORCID: https://orcid.org/0000-0003-4000-3030)
- Jianhua Zhang (ORCID: https://orcid.org/0000-0002-6492-3846)
Institutions
- Shanghai University (CN)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/sslchinaifws64644.2024.10835377
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Natural Science Foundation of Shanghai
- National Natural Science Foundation of China
- National Key Research and Development Program of China