A Monolithically Integrated Voltage Reference based on AlGaN/GaN Schottky Gate HEMTs

In this work, a monolithically integrated voltage reference based on AlGaN/GaN Schottky Gate High Electron Mobility Transistor (SG-HEMTs) technology is proposed and studied by TCAD simulations. This simple but stable voltage reference consists of only two D-mode transistors with different threshold voltages, which can generate a predictable reference voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf>) and maintain high stability over a wide range of supply voltage and temperature. It is verified by TCAD simulations that V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf> of 1.48V is realized for the power supply voltage range of 3.3 to 10 V. In the temperature range of 300 K to 500 K, the sensitivity of the VREF line is 0.064%/V and the temperature coefficient is 8.21 ppm/°C. The proposed design of the reference voltage source composed of double D-mode SG-HEMT exhibits high feasibility, and can be used in bias and detection circuits to reduce the circuit complexity and chip area.

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Publication Details

Published
2024-11-18
DOI
https://doi.org/10.1109/sslchinaifws64644.2024.10835377
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.00

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article

A Monolithically Integrated Voltage Reference based on AlGaN/GaN Schottky Gate HEMTs

Luqiao Yin, Wen‐Qing Lu, Kailin Ren, Jianhua Zhang
GaN-based semiconductor devices and materials
article

A Monolithically Integrated Voltage Reference based on AlGaN/GaN Schottky Gate HEMTs

Luqiao Yin, Wen‐Qing Lu, Kailin Ren, Jianhua Zhang
article en

Abstract

In this work, a monolithically integrated voltage reference based on AlGaN/GaN Schottky Gate High Electron Mobility Transistor (SG-HEMTs) technology is proposed and studied by TCAD simulations. This simple but stable voltage reference consists of only two D-mode transistors with different threshold voltages, which can generate a predictable reference voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf>) and maintain high stability over a wide range of supply voltage and temperature. It is verified by TCAD simulations that V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">REF</inf> of 1.48V is realized for the power supply voltage range of 3.3 to 10 V. In the temperature range of 300 K to 500 K, the sensitivity of the VREF line is 0.064%/V and the temperature coefficient is 8.21 ppm/°C. The proposed design of the reference voltage source composed of double D-mode SG-HEMT exhibits high feasibility, and can be used in bias and detection circuits to reduce the circuit complexity and chip area.

Shanghai University (CN)
Natural Science Foundation of Shanghai, National Natural Science Foundation of China, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 84%
GaN-based semiconductor devices and materials
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A Monolithically Integrated Voltage Reference based on AlGaN/GaN Schottky Gate HEMTs — Luqiao Yin, Wen‐Qing Lu, et al. · (2024) | TGRS Research Map | TGRS