Monolithic Integrated p-GaN HEMT with Lateral Rectifier to Reduce the Dead Time Loss

p-GaN HEMTs are favored for bridge topology applications where they act as the freewheeling transistors to commute the current at the dead time. To address the false turn-on by crosstalk, a negative turn-off voltage is commonly used. Unlike Si or SiC MOSFESTs, the negative turn-off voltage will increase the voltage drop of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DS</inf> and the dead time loss. To reduce the dead time loss, a monolithic integrated p-GaN HEMT, coupled with a lateral rectifier (LR), is fabricated. The electrical test shows there is no degradation when it works in the forward operation. Additionally, a synchronous buck converter was constructed to test the effectiveness of this approach in a circuit-level application. Experimental data demonstrate a 31 % reduction of the dead time loss and a significant decrease in current oscillation at the dead time.

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Publication Details

Published
2024-11-18
DOI
https://doi.org/10.1109/sslchinaifws64644.2024.10835278
Primary Topic
GaN-based semiconductor devices and materials
Type
article
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article

Monolithic Integrated p-GaN HEMT with Lateral Rectifier to Reduce the Dead Time Loss

Yufei Tian, Xinhong Cheng
GaN-based semiconductor devices and materials
article

Monolithic Integrated p-GaN HEMT with Lateral Rectifier to Reduce the Dead Time Loss

Yufei Tian, Xinhong Cheng
article en

Abstract

p-GaN HEMTs are favored for bridge topology applications where they act as the freewheeling transistors to commute the current at the dead time. To address the false turn-on by crosstalk, a negative turn-off voltage is commonly used. Unlike Si or SiC MOSFESTs, the negative turn-off voltage will increase the voltage drop of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DS</inf> and the dead time loss. To reduce the dead time loss, a monolithic integrated p-GaN HEMT, coupled with a lateral rectifier (LR), is fabricated. The electrical test shows there is no degradation when it works in the forward operation. Additionally, a synchronous buck converter was constructed to test the effectiveness of this approach in a circuit-level application. Experimental data demonstrate a 31 % reduction of the dead time loss and a significant decrease in current oscillation at the dead time.

Chinese Academy of Sciences (CN), Shanghai Institute of Microsystem and Information Technology (CN)
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GaN-based semiconductor devices and materials
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