Monolithic Integrated p-GaN HEMT with Lateral Rectifier to Reduce the Dead Time Loss
p-GaN HEMTs are favored for bridge topology applications where they act as the freewheeling transistors to commute the current at the dead time. To address the false turn-on by crosstalk, a negative turn-off voltage is commonly used. Unlike Si or SiC MOSFESTs, the negative turn-off voltage will increase the voltage drop of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DS</inf> and the dead time loss. To reduce the dead time loss, a monolithic integrated p-GaN HEMT, coupled with a lateral rectifier (LR), is fabricated. The electrical test shows there is no degradation when it works in the forward operation. Additionally, a synchronous buck converter was constructed to test the effectiveness of this approach in a circuit-level application. Experimental data demonstrate a 31 % reduction of the dead time loss and a significant decrease in current oscillation at the dead time.
Authors
- Yufei Tian (ORCID: https://orcid.org/0009-0009-6145-697X)
- Xinhong Cheng (ORCID: https://orcid.org/0000-0001-6235-1728)
Institutions
- Chinese Academy of Sciences (CN)
- Shanghai Institute of Microsystem and Information Technology (CN)
Publication Details
- Published
- 2024-11-18
- DOI
- https://doi.org/10.1109/sslchinaifws64644.2024.10835278
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00