Statistical Analysis of Historical SEL Test Data to Provide a Priori Risk Estimates for Use of Unhardened CMOS Parts
Single-event latchup (SEL) is a serious obstacle to the use of state-of-the-art microelectronics in space systems, and a priori prediction of SEL susceptibility has proved elusive. We develop SEL risk-assessment tools based on the analysis of large archives of SEL test data for unhardened complementary metal-oxide–semiconductor (CMOS) parts. Results include a flexible method for bounding SEL rates even with minimal test data.
Authors
- Sergeh Vartanian
- Gregory R. Allen (ORCID: https://orcid.org/0000-0001-8620-1273)
- Farokh Irom (ORCID: https://orcid.org/0000-0001-9990-5050)
- Razvan Gaza
- Jonathan D. Barth
- Ray Ladbury (ORCID: https://orcid.org/0000-0002-5674-4557)
- Robert F. Hodson
Institutions
- Goddard Space Flight Center (US)
- Langley Research Center (US)
- Jet Propulsion Laboratory (US)
- Johnson Space Center (US)
Publication Details
- Journal
- IEEE Transactions on Nuclear Science
- Published
- 2025-01-16
- DOI
- https://doi.org/10.1109/tns.2025.3530844
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00