A 32 μm2 MOS-Based Remote Sensing Temperature Sensor with 1.29 °C Inaccuracy for Thermal Management
This paper introduces a compact NMOS-based temperature sensor designed for precise thermal management in high-performance integrated circuits. Fabricated using the TSMC 180 nm process with a 1.8 V supply, this sensor employs a single diode-connected NMOS transistor, achieving a significant size reduction and improved voltage headroom. The sensor’s area is 32 µm2 per unit, enabling dense integration around thermal hotspots. A novel voltage calibration method ensures accurate temperature extraction. The measurement results demonstrate three-sigma errors within ±0.1 °C in the critical range of 75 °C to 95 °C and +1.29/−1.08 °C outside this range, confirming the sensor’s high accuracy and suitability for advanced thermal management applications.
Authors
- Ruohan Yang (ORCID: https://orcid.org/0000-0003-0279-7212)
- Kwabena Oppong Banahene
- Bryce Gadogbe (ORCID: https://orcid.org/0009-0004-9930-0894)
- Degang J. Chen (ORCID: https://orcid.org/0000-0002-5938-6329)
- R.L. Geiger
Institutions
- Iowa State University (US)
Publication Details
- Journal
- Computers
- Published
- 2025-01-16
- DOI
- https://doi.org/10.3390/computers14010026
- Primary Topic
- Analog and Mixed-Signal Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Semiconductor Research Corporation