SOME METHODS FOR DATA FLOW SYNCHRONIZATION IN DIGITAL SIGNAL PROCESSING SYSTEMS

Growing user requirements for data exchange rates in telecommunication systems have resulted inthe active adoption of mm-band wavelengths and the intensive development of broadband communicationsystems. Designing mm-wave microwave devices using CAD requires accurate frequency-dependent relativepermittivity data for the used substrate to reduce the device design time. This paper focuses on determiningthe relative dielectric constant of the Rogers 3003G2 substrate in the mm-wavelength range. Bothnon-resonant and resonant methods were used to find the dielectric permittivity. The automation of themeasurement data processing was achieved by using the developed script in MATLAB. The relative permittivityof the substrate in the band 1-42 GHz was determined by applying the phase difference method,using two microstrip lines of different lengths. SIW resonators with waveguide excitation were developedto avoid using a probe station with fragile probes for S-parameter measurements in the mm-length range.The relative permittivity of the studied substrate in the 60-170 GHz range was found using three prototypemulti-mode SIW resonators. A set of single-mode SIW resonators with different waveguide excitation couplingwas produced to avoid ambiguity in longitudinal mode number determination in multi-mode SIWresonators. Several loaded resonant frequencies were obtained by varying the length of SIW-resonators'excitation slots to calculate the unloaded resonant frequency used to find the relative dielectric permittivityof the substrate. Recommendations for developing SIW resonators for the determination of dielectricproperties of the substrates are given in the conclusion section.