Enhancing Process Image Analysis with Adaptive Thresholding and Deep Learning Techniques

This paper presents a deep learning model specifically designed to effectively classify display Mura images. The model leverages advanced deep learning techniques and computer vision methods to identify and categorize various types of Mura based on their unique digital signatures and visual patterns. It aims to provide fast and accurate classification results, enabling real-time processing of large-scale image data. The model is expected to significantly enhance content management and user experience with display Mura, and it can be innovatively applied across various fields of image classification.

Authors

Publication Details

Published
2024-10-14
DOI
https://doi.org/10.1109/ist63414.2024.10759145
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00
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article

Enhancing Process Image Analysis with Adaptive Thresholding and Deep Learning Techniques

Sungjae Hwang, Do Gyun Kim, Hongbeen Park
Industrial Vision Systems and Defect Detection
article

Enhancing Process Image Analysis with Adaptive Thresholding and Deep Learning Techniques

Sungjae Hwang, Do Gyun Kim, Hongbeen Park
article en

Abstract

This paper presents a deep learning model specifically designed to effectively classify display Mura images. The model leverages advanced deep learning techniques and computer vision methods to identify and categorize various types of Mura based on their unique digital signatures and visual patterns. It aims to provide fast and accurate classification results, enabling real-time processing of large-scale image data. The model is expected to significantly enhance content management and user experience with display Mura, and it can be innovatively applied across various fields of image classification.

Openalex Percentile: Top 62%
Industrial Vision Systems and Defect Detection
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Enhancing Process Image Analysis with Adaptive Thresholding and Deep Learning Techniques — Sungjae Hwang, Do Gyun Kim, et al. · (2024) | TGRS Research Map | TGRS