Directed Testing of ORAN using a Partially Specified Declarative Digital Twin

Real Time performance testing can be divided into two distinct parts: system test and algorithm test. System test checks that the right functions operate on the right data within power, latency, and other constraints under all conditions. Major RAN OEMs, put as much effort into system test and debug as they do into algorithm test, to ensure a competitive product. An algorithm tester will provide little insight into real time and hardware-software (HW-SW) capacity as it is unaware of the system implementation. In this paper we present an innovative Digital Twin technology, which we call Declarative Digital Twin (DDT). A DDT can describe the system requirements of the RAN such that critical corner cases can be found via automation, that would normally be missed by conventional testing. This is possible even when the RAN requirements are only partially specified. We present a Domain Specific Language (DSL) for declarative description of the RAN and show results from an automated solver that demonstrate how potential HW-SW implementation related corner cases can be identified from the DDT of an ORAN DU.

Authors

Institutions

Publication Details

Published
2024-10-07
DOI
https://doi.org/10.1109/vtc2024-fall63153.2024.10758052
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Directed Testing of ORAN using a Partially Specified Declarative Digital Twin

Alan Gatherer, Chaitali Sengupta, Sudipta Sen, John H. Reed
Integrated Circuits and Semiconductor Failure Analysis
article

Directed Testing of ORAN using a Partially Specified Declarative Digital Twin

Alan Gatherer, Chaitali Sengupta, Sudipta Sen, John H. Reed
article en

Abstract

Real Time performance testing can be divided into two distinct parts: system test and algorithm test. System test checks that the right functions operate on the right data within power, latency, and other constraints under all conditions. Major RAN OEMs, put as much effort into system test and debug as they do into algorithm test, to ensure a competitive product. An algorithm tester will provide little insight into real time and hardware-software (HW-SW) capacity as it is unaware of the system implementation. In this paper we present an innovative Digital Twin technology, which we call Declarative Digital Twin (DDT). A DDT can describe the system requirements of the RAN such that critical corner cases can be found via automation, that would normally be missed by conventional testing. This is possible even when the RAN requirements are only partially specified. We present a Domain Specific Language (DSL) for declarative description of the RAN and show results from an automated solver that demonstrate how potential HW-SW implementation related corner cases can be identified from the DDT of an ORAN DU.

Cirrus Logic (United States) (US), Virginia Tech (US)
Openalex Percentile: Top 76%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Directed Testing of ORAN using a Partially Specified Declarative Digital Twin — Alan Gatherer, Chaitali Sengupta, et al. · (2024) | TGRS Research Map | TGRS