Research on IGBT Lifespan Prediction Method Based on LSTM

In recent years, as a critical component in high-voltage and high-power converters, the reliability of IGBT modules has garnered significant attention. In practical applications, IGBTs often operate under extreme conditions, leading to fatigue accumulation, damage, and aging of the power modules, which can result in unplanned system downtime. Predicting the lifespan of IGBTs can help mitigate economic losses. Relevant studies have shown that the lifespan of IGBTs is closely related to junction temperature. Therefore, this paper employs an LSTM algorithm based on RNN to predict the lifespan of IGBT modules. Experimental results demonstrate that this model provides a more accurate prediction of IGBT module lifespan.