Measurement and Suppression Techniques for Leakage Current in Photovoltaic Inverters: Topology Enhancements and Carrier Modulation Optimization

With the widespread use of electronic equipment across various industries, the impact of leakage current on such equipment has garnered increasing attention. Issues such as circuit aging and equipment instability caused by leakage current are becoming increasingly concerning. As a result, measuring and mitigating leakage current has become a critical aspect of the design and testing of electronic equipment. This paper reviews the current techniques for leakage current measurement and suppression. Firstly, two primary methods for leakage current measurement are introduced: the first is the capacitive leakage current measurement method, which utilizes a polarized high-voltage source and current measurement module; the second is the indirect measurement method, which measures the voltage across a resistor to infer the leakage current. Following this, the paper discusses various techniques for suppressing leakage current, including methods for improving circuit structures and optimizing switching drive circuits. Finally, the advantages and disadvantages of each method are summarized, along with an assessment of their potential applications. This review aims to provide valuable insights into future research and engineering practice related to leakage current measurement and suppression.