Two-carrier model-fitting of Hall effect in semiconductors with dual-band occupation: A case study in GaN two-dimensional hole gas
We develop a two-carrier Hall effect model-fitting algorithm to analyze temperature-dependent magnetotransport measurements of a high-density (∼4×1013cm−2) polarization-induced two-dimensional hole gas (2DHG) in a GaN/AlN heterostructure. Previous transport studies in GaN 2DHGs have reported a twofold reduction in 2DHG carrier density when cooled from room to cryogenic temperature. We demonstrate that this apparent drop in carrier density is an artifact of assuming one species of charge carrier when interpreting Hall effect measurements. Using an appropriate two-carrier model, we resolve light hole (LH) and heavy hole (HH) carrier densities congruent with self-consistent Poisson-k⋅p simulations and observe an LH mobility of ∼1400 cm2/Vs and HH mobility of ∼300 cm2/Vs at 2 K. This report constitutes the first experimental signature of LH band conductivity reported in GaN.
Authors
- Debdeep Jena (ORCID: https://orcid.org/0000-0002-4076-4625)
- Joseph E. Dill (ORCID: https://orcid.org/0000-0003-0537-4477)
- Huili Grace Xing (ORCID: https://orcid.org/0000-0002-2709-3839)
- Chuan F. C. Chang (ORCID: https://orcid.org/0009-0004-1017-284X)
Institutions
- Cornell University (US)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2025-01-09
- DOI
- https://doi.org/10.1063/5.0248998
- Citations
- 7
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 8.81
Funders
- National Science Foundation
- U.S. Department of Energy
- Semiconductor Research Corporation
- Defense Advanced Research Projects Agency
- Office of Science
- Division of Materials Research
- Basic Energy Sciences
- Defense Sciences Office, DARPA
- Army Research Office