Design of thermal cycling accelerated aging test platform for power diode

Power diode is a special type of semiconductor device mainly used in circuit rectification When the diode fails, it will have an adverse effect on the power system. The study of power diode fault prediction is essential to improve the reliability of power systems. By analysing the failure mode and aging characteristics of power diodes, the forward voltage drop can be considered as a characteristic parameter of diode aging. A platform for thermal cycle aging of power diodes is designed. The platform supports thermal cycling control and parameter acquisition, the former can control the cycle times and aging temperature, and the latter can obtain the forward voltage drop during diode aging process.