Lifetime evaluation of SiC modules in aviation converters over multiple time scales
Aviation converters are core components of aircraft onboard systems, and their reliability is affected by power fluctuations in the drive system. However, due to the limitations of long-term mission profiles, the current methods for calculating junction temperature on several time scales limit the reliability assessment of SiC modules in aircraft converters, making it challenging to accurately and quickly evaluate the lifetime of power devices. This paper takes the X-57 electric aircraft high-lift motor drive system as an example, dividing the aviation converter's long-term mission profile. Utilizing numerical calculation methods for device junction temperature, combined with flight altitude and temperature data, the thermal parameters of the device over multi-scale mission profiles are quickly calculated. Finally, through the device lifetime evaluation method, the lifetime consumption of the power modules is computed, and an analysis is conducted on the effect of multi-time-scale mission patterns on power module lifetime consumption.
Authors
- Zhangang Yang (ORCID: https://orcid.org/0000-0001-8918-2872)
- Qingyu Zhou (ORCID: https://orcid.org/0000-0002-4389-1582)
Institutions
- Civil Aviation University of China (CN)
Publication Details
- Journal
- IET conference proceedings.
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1049/icp.2024.2989
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00