Improved threshold voltage stability for GaN p-channel field effect transistors by hydrogen plasma treatment

Abstract This work proposes a novel gate stack with hydrogen (H) plasma treatment to improve the stability of p-channel field effect transistors (p-FETs). The threshold voltage ( V TH ) of this device is −4.82 V, achieving normally-off operation, with exhibiting an I on / I off ratio of 10 6 and a low off-state leakage current of −10 −7 mA mm −1 at V GS = 2 V. The H plasma-treated gate stack significantly stabilizes the V TH of GaN p-FETs, exhibiting minimal variations of 0.14 V and 0.15 V under negative (−5 V) and positive (5 V) gate voltages, respectively. H plasma treatment technology optimizes the sub-gate interface and enhances the threshold voltage stability of the device, guaranteeing the stable application of p-FETs in logic circuits.

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Publication Details

Journal
Journal of Physics D Applied Physics
Published
2025-01-09
DOI
https://doi.org/10.1088/1361-6463/ada809
Citations
1
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.26

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article

Improved threshold voltage stability for GaN p-channel field effect transistors by hydrogen plasma treatment

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Journal of Physics D Applied Physics
GaN-based semiconductor devices and materials
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article

Improved threshold voltage stability for GaN p-channel field effect transistors by hydrogen plasma treatment

Chunfeng Hao, Jiaan Zhou, Y. Zhang, An‐Ping Li, Runxian Xing, Jinxia Jiang, Zhongming Zeng, S.L. Lu, Yang An, Li Yu, Guohao Yu, Baoshun Zhang, Bohan Guo, Yong Cai, Huixin Yue
article en
1 citations

Abstract

Abstract This work proposes a novel gate stack with hydrogen (H) plasma treatment to improve the stability of p-channel field effect transistors (p-FETs). The threshold voltage ( V TH ) of this device is −4.82 V, achieving normally-off operation, with exhibiting an I on / I off ratio of 10 6 and a low off-state leakage current of −10 −7 mA mm −1 at V GS = 2 V. The H plasma-treated gate stack significantly stabilizes the V TH of GaN p-FETs, exhibiting minimal variations of 0.14 V and 0.15 V under negative (−5 V) and positive (5 V) gate voltages, respectively. H plasma treatment technology optimizes the sub-gate interface and enhances the threshold voltage stability of the device, guaranteeing the stable application of p-FETs in logic circuits.

Journal of Physics D Applied PhysicsVol. 58(11)
University of Science and Technology of China (CN), Chinese Academy of Sciences (CN), Suzhou University of Science and Technology (CN), Suzhou Institute of Nano-tech and Nano-bionics (CN)
National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences
Affordable and clean energy
Openalex Percentile: Top 25%
GaN-based semiconductor devices and materials
1.26
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