Bias Calibration of X-Band Radar Reflectivity Factor System Based on Parametric Self-Consistency Principle

The evolution of DSD and scattering characteristics during cloud precipitation processes determines the quantifiable constraint relationship between the dual-polarization parameters, known as the self-consistency principle of the parameters. This article further develops the self-consistency principle constraint relationship for dual-polarization parameters in the X-band and designs a correction relationship for the parameter bias of radar reflectivity factor. Experimental results show that under appropriate conditions, correcting the system bias of the X-band dual-polarization radar reflectivity factor using the improved self-consistency principle can improve the accuracy and stability of the correction results.

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Published
2024-11-01
DOI
https://doi.org/10.1109/iwceaa63616.2024.10823971
Primary Topic
Optical Systems and Laser Technology
Type
article
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article

Bias Calibration of X-Band Radar Reflectivity Factor System Based on Parametric Self-Consistency Principle

Caizheng Guo, Wei Wang, Yintao Wei, Z.L. Long
Optical Systems and Laser Technology
article

Bias Calibration of X-Band Radar Reflectivity Factor System Based on Parametric Self-Consistency Principle

Caizheng Guo, Wei Wang, Yintao Wei, Z.L. Long
article en

Abstract

The evolution of DSD and scattering characteristics during cloud precipitation processes determines the quantifiable constraint relationship between the dual-polarization parameters, known as the self-consistency principle of the parameters. This article further develops the self-consistency principle constraint relationship for dual-polarization parameters in the X-band and designs a correction relationship for the parameter bias of radar reflectivity factor. Experimental results show that under appropriate conditions, correcting the system bias of the X-band dual-polarization radar reflectivity factor using the improved self-consistency principle can improve the accuracy and stability of the correction results.

Civil Aviation Administration of China (CN), Chengdu University of Information Technology (CN)
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Optical Systems and Laser Technology
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