Bias Calibration of X-Band Radar Reflectivity Factor System Based on Parametric Self-Consistency Principle
The evolution of DSD and scattering characteristics during cloud precipitation processes determines the quantifiable constraint relationship between the dual-polarization parameters, known as the self-consistency principle of the parameters. This article further develops the self-consistency principle constraint relationship for dual-polarization parameters in the X-band and designs a correction relationship for the parameter bias of radar reflectivity factor. Experimental results show that under appropriate conditions, correcting the system bias of the X-band dual-polarization radar reflectivity factor using the improved self-consistency principle can improve the accuracy and stability of the correction results.
Authors
- Caizheng Guo
- Wei Wang (ORCID: https://orcid.org/0000-0002-3143-0623)
- Yintao Wei (ORCID: https://orcid.org/0000-0003-0673-9095)
- Z.L. Long (ORCID: https://orcid.org/0009-0002-6846-0591)
Institutions
- Civil Aviation Administration of China (CN)
- Chengdu University of Information Technology (CN)
Publication Details
- Published
- 2024-11-01
- DOI
- https://doi.org/10.1109/iwceaa63616.2024.10823971
- Primary Topic
- Optical Systems and Laser Technology
- Type
- article
- Field-Weighted Citation Impact
- 0.00