Friction Force Calibration in Scanning Probe Microscopy
Quantitative measurement of frictional force by atomic force microscopy requires converting the output voltage signal of photo-detector into force using the torsional spring constant of cantilever and the lateral sensitivity of photo-detector. Various calibration methods have been proposed. This paper reviews the useful experimental calibration methods.
Authors
- Koji Miyake (ORCID: https://orcid.org/0000-0001-9277-4975)
Institutions
- National Institute of Advanced Industrial Science and Technology (JP)
Publication Details
- Journal
- Vacuum and Surface Science
- Published
- 2025-01-09
- DOI
- https://doi.org/10.1380/vss.68.31
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00