A reliability assessment method for complex electronic systems based on Vine copula and Inverse Gaussian process

Complex electronic systems are integral to signal transformation and information transmission. Therefore, it is crucial to assess and predict their reliability to ensure safe operation and enhance economic efficiency. These systems are characterized by high reliability, long lifespans, multiple performance parameters, and complex, multi-source failure mechanisms, which often manifest as the simultaneous degradation of multiple performance parameters. Due to the intricate internal structure and manufacturing processes, the degradation processes are often correlated. Thus, accurately assessing the reliability of complex electronic systems is particularly important. This paper proposes using the Inverse Gaussian (IG) process to describe the degradation process of a single performance characterization parameter in complex electronic systems. Additionally, the correlation of multiple performance characterization parameters is modeled using the Vine copula. Finally, the proposed theory is illustrated with a practical example of a specific type of electronic system.