Modified information criterion for change-point gamma process model

In practical scenarios, the degradation process of components like often exhibits multi-stage characteristics due to internal degradation mechanisms and external environmental factors. For precise analysis of the reliability characteristics of these components, identifying the change-point location is essential. It enables researchers and engineers to select or develop a change-point model that accurately depicts these behaviors. Traditional methods to detect change points are time-consuming; therefore, employing a modified information criterion method to detect the existence and estimate the change-point location presents a viable alternative. The efficacy of this method is evaluated through several numerical simulations. Subsequently, this approach is applied to metal oxide semiconductor field-effect transistor data to demonstrate its practical application.