Accelerated degradation modeling and transfer of multilayer ceramic capacitors

Multilayer ceramic capacitors (MLCCs) are extensively utilized across various industrial sectors, and their failure can result in significant losses. Thus, it is crucial to investigate the degradation of MLCCs under varying environmental stresses. In this study, multilayer ceramic capacitors produced with diverse parameters are examined. Environmental stresses, specifically different temperatures and voltages, are applied to conduct accelerated degradation tests on these capacitors. Through the fitting of degradation data, accelerated degradation models for the capacitors under different stresses are developed. Analysis of these models elucidates the degradation pattern of the capacitors, offering valuable insights for understanding capacitor failure. Moreover, by transferring MLCCs of different specifications but identical materials from the same manufacturer and production line, the relationship between manufacturing parameters and model coefficients can be inferred. This is significant for predicting the lifespan of MLCCs.