Unraveling the influence of substrate surface and temperature on microstructural evolution of crystalline MoS<sub>2</sub> in atomic layer deposition
In this study, we examine the atomic layer deposition (ALD) growth behavior of crystalline MoS 2 films on various substrates, including SiO 2 , mica, and Al 2 O 3 , at deposition temperatures of ≥650 °C.
Authors
- Seong Keun Kim (ORCID: https://orcid.org/0000-0001-8712-7167)
- Seung Ho Ryu (ORCID: https://orcid.org/0000-0003-1312-6836)
Institutions
- Korea University (KR)
- Korea Institute of Science and Technology (KR)
Publication Details
- Journal
- Journal of Materials Chemistry C
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d4tc04752d
- Citations
- 4
- Primary Topic
- Metal and Thin Film Mechanics
- Type
- article
- Field-Weighted Citation Impact
- 3.45