Analog circuit fault diagnosis method using auto-encoder based feature extraction

Motivated by the development of artificial intelligence, data-driven fault diagnosis for analogue circuits has become popular. Data-driven methods commonly include two stages: the feature extraction stage and the fault isolation stage. Traditional feature extraction methods, mainly using signal processing, suffer from the problem of information loss and are highly dependent on prior knowledge. In order to deal with the limitations above, a semi-supervised representation learning method is proposed for fault diagnosis. An autoencoder-based structure is adopted to establish a mathematical encoder. The proposed encoder can directly capture the latent feature from the original signal data without traditional data processing. And then a two-layer neural network is applied to further fault classification task. Experiments on two classical filter circuits are performed to demonstrate the effectiveness and merits of the proposed fault diagnosis method for analogue circuits.

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Publication Details

Journal
IET conference proceedings.
Published
2025-01-01
DOI
https://doi.org/10.1049/icp.2024.2824
Citations
1
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
2.27
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article

Analog circuit fault diagnosis method using auto-encoder based feature extraction

Jiaming Zhao, Yijiu Zhao, Naixin Zhou, Shibo Chen
1 citations
IET conference proceedings.
VLSI and Analog Circuit Testing
2.27
article

Analog circuit fault diagnosis method using auto-encoder based feature extraction

Jiaming Zhao, Yijiu Zhao, Naixin Zhou, Shibo Chen
article en
1 citations

Abstract

Motivated by the development of artificial intelligence, data-driven fault diagnosis for analogue circuits has become popular. Data-driven methods commonly include two stages: the feature extraction stage and the fault isolation stage. Traditional feature extraction methods, mainly using signal processing, suffer from the problem of information loss and are highly dependent on prior knowledge. In order to deal with the limitations above, a semi-supervised representation learning method is proposed for fault diagnosis. An autoencoder-based structure is adopted to establish a mathematical encoder. The proposed encoder can directly capture the latent feature from the original signal data without traditional data processing. And then a two-layer neural network is applied to further fault classification task. Experiments on two classical filter circuits are performed to demonstrate the effectiveness and merits of the proposed fault diagnosis method for analogue circuits.

IET conference proceedings.Vol. 2024(9)
University of Electronic Science and Technology of China (CN)
Climate action
Openalex Percentile: Top 19%
VLSI and Analog Circuit Testing
2.27
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Analog circuit fault diagnosis method using auto-encoder based feature extraction — Jiaming Zhao, Yijiu Zhao, et al. · IET conference proceedings. (2025) | TGRS Research Map | TGRS