Measurement and computation method for internally generated heat in single LAYER ceramic capacitor (SLCC) in electronic circuit

The purpose is to deeper understand the heat generation of ceramic capacitors in electronic circuits when the voltages and frequencies there have been changed, so that the application reliability of electronic products can be improved; by the mean of experimentation, when the voltages and frequencies of Category Ⅱ single layer ceramic capacitors (SLCC) were changed, their surface temperature showed rising and dropping caused by their internally generated heat. The quick testing method is created, which aims to monitor the temperature changes of electronic components when voltage and frequency in the circuit changing. Meanwhile, the equations about the relations between temperature rise and voltage, frequency of SLCC have been discovered, when voltages and frequencies of SLCC are changed asynchronously and simultaneously in circuits. Therefore, it can be a reference provided for the engineers in the field of electronics to precisely apply SLCC when they design electronic circuit, so as to ensure the designed electronic products to be safe and reliable. Besides, it can also be a prompt detecting method when there are heat generation faults for the ceramic capacitors in circuits in practice.