Accurate and Robust Wide‐Range Luminescent Microthermometer Based on ALD‐Encapsulated Ga<sub>2</sub>O<sub>3</sub>:Cr DBR Microcavities (Adv. Mater. Technol. 1/2025)
Luminescence Thermometry Atomic layer deposition (ALD) is a powerful technique for achieving smooth and robust distributed Bragg reflector (DBR) coatings on microwire ends. In article number 2400881, Manuel Alonso-Orts and co-workers create optical microcavities with ALD-coated, chromium-doped gallium oxide (Ga2O3:Cr) microwires and demonstrate their use for wide-range temperature sensors with high stability, precision and accuracy, monitoring the temperature-induced spectral shifts of the resonant peaks.
Authors
- Martin Eickhoff (ORCID: https://orcid.org/0000-0001-6493-269X)
- Bianchi Méndez (ORCID: https://orcid.org/0000-0002-6289-7437)
- Emilio Nogales (ORCID: https://orcid.org/0000-0003-3376-6320)
- Manuel Alonso‐Orts (ORCID: https://orcid.org/0000-0001-5043-4921)
- Marco Schowalter (ORCID: https://orcid.org/0000-0001-5391-6934)
- Andreas Rosenauer (ORCID: https://orcid.org/0000-0003-4742-0451)
- Daniel Carrasco (ORCID: https://orcid.org/0000-0002-7936-8187)
- Ruben J. T. Neelissen
Institutions
- Universidad Complutense de Madrid (ES)
- University of Bremen (DE)
- Staats- und Universitätsbibliothek Bremen (DE)
Publication Details
- Journal
- Advanced Materials Technologies
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1002/admt.202570001
- Citations
- 1
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.43